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New DMI6000 B Inverted Microscope from Leica Microsystems

Leica Microsystems, developer of precision optical systems, has designed a new DMI6000 B inverted microscope that features an adaptive focus control (AFC).

From Leica Microsystems GmbH 22 Oct 2010

Electron Microscopy Booklet from FEI

Scientific instruments company, FEI has published a new booklet titled, ‘An Introduction to Electron Microscopy’. The booklet provides details on the electron- and ion-beam microscopy.

21 Oct 2010

Comprehensive Report on Microscopy Markets

Research and Markets has published a new report, titled ‘Microscopy Markets’. The report provides a comprehensive study of market segments of various microscopes deployed in research and clinical laboratories.

21 Oct 2010

Olympus Adds Laser Sharing Capabilities to Fluoview FV1000MPE and FV1000 Microscopes

Olympus has added dual port SIM scanning and laser sharing capabilities to the Fluoview FV1000MPE multiphoton laser scanning and FV1000 confocal laser scanning microscopes.

19 Oct 2010

Bruker Acquires Veeco’s OIM and AFM Businesses

Bruker, a provider of scientific devices, has purchased the optical industrial metrology (OIM) and atomic force microscopy (AFM) instruments businesses of Veeco Instruments, for $229.4 million.

15 Oct 2010

UCLA Scientists Develop Lens-Free Electron Microscope

UCLA researchers have developed a new, advanced lens-free electron microscope that is ideal for veterinarians to determine the fertility of animals.

14 Oct 2010

Olympus Introduces Extended Configurations to FluoView FV1000 and Fluoview FV1000MPE

Olympus has introduced advanced laser sharing and dual port SIM scanning capabilities to its FluoView FV1000 confocal laser scanning and FluoView FV1000MPE multiphoton laser scanning microscopes.

13 Oct 2010

New Reflected Light Microscope for Materials Scientists from Carl Zeiss

Carl Zeiss introduces the Axio Lab.A1 microscope for examinations in reflected light in the materials sciences. It’s particularly intuitive operation makes this upright microscope suitable for routine lab applications in metallography, quality control and for inspection tasks in production lines.

From Carl Zeiss Microscopy GmbH 12 Oct 2010

3D Holography Permits Accurate Analysis on Scales from the Desktop to the Sea

Counting and tracking particle movement in 3D is one of today’s biggest imaging challenges. Using powerful 3D analysis and holographic imaging technology, Resolution Optics’ new DIHM series has successfully tackled these challenges

From Resolve Optics Ltd. 12 Oct 2010

FEI, Nanonics to Explore the Integration of AFM with DualBeam System

Provider of electron microscope systems, FEI, has announced that it has partnered with Nanonics Imaging, manufacturer of combined near-field optical microscopes.

7 Oct 2010