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Electron Microscopy Booklet from FEI

Editorial Checklist

Reviewed

Oct 21 2010

Scientific instruments company, FEI has published a new booklet titled, ‘An Introduction to Electron Microscopy’. The booklet provides details on the electron- and ion-beam microscopy.

FEI’s 40-page booklet is suitable for business professionals or students interested in the area of nanotechnology. The guide covers a number of topics such as DualBeam systems, focused ion beam, scanning transmission electron, scanning electron, and terminology, technology, applications and history of transmission electron. The image examples provided in the booklet cover various samples, including viruses, blood cells, minerals, steel, semiconductors and pollen.

FEI offers electron and ion beam microscopes as well as tools for nanoscale applications in various industries such as natural resources, data storage, semiconductors, life sciences, and academic and industrial materials research. FEI’s imaging systems offer 3-D characterization, modification/prototyping and analysis with resolutions to the sub-Angstrom level.

Source:

http://www.fei.com

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