Posted in | News | Microscopy

Electron Microscopy Booklet from FEI

Scientific instruments company, FEI has published a new booklet titled, ‘An Introduction to Electron Microscopy’. The booklet provides details on the electron- and ion-beam microscopy.

FEI’s 40-page booklet is suitable for business professionals or students interested in the area of nanotechnology. The guide covers a number of topics such as DualBeam systems, focused ion beam, scanning transmission electron, scanning electron, and terminology, technology, applications and history of transmission electron. The image examples provided in the booklet cover various samples, including viruses, blood cells, minerals, steel, semiconductors and pollen.

FEI offers electron and ion beam microscopes as well as tools for nanoscale applications in various industries such as natural resources, data storage, semiconductors, life sciences, and academic and industrial materials research.  FEI’s imaging systems offer 3-D characterization, modification/prototyping and analysis with resolutions to the sub-Angstrom level.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.