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A Great Range of Tutorials on Basics in Microscopy from Leica Science Lab

Article - 24 May 2012

Explore microscopy basics and advanced techniques with Leica Science Lab's interactive tutorials, articles, and community discussions.
Overview and Product Solutions for Raman Spectroscopy

Article - 3 Sep 2010

It is the shift in wavelength of the inelastically scattered radiation that provides the chemical and structural information.
Largest Laser in the World is Picking up Speed

Article - 13 Jan 2008

Scientists and technicians at the NIF are quickening their pace to install and test the rest of NIF’s 192 lasers.
An Introduction to What Color Is and How Color is Made

Article - 29 Aug 2007

This article discusses color, what it is and how it is made.
Employing Pinhole-Type Lightfield Monitors to Overcome Chromatic Aliasing

Article - 3 Nov 2021

The article evaluates the ability of pinhole-type lightfield monitors to provide a convincing 3D experience—images with enough brightness and continuous aspect. The research was published in the...
Head-Up Displays: System Benefits from 2D to AR

Article - 23 Nov 2020

In this interview Matt Scholz, Automotive Business Leader At Radiant Vision Systems, discusses Head-Up Displays, their benefits and where the future of the technology may lie.
Microscopy Techniques: An Overview

Article - 19 Nov 2021

In this article, Andor Instruments discusses various microscopy techniques, providing a brief overview for each. This includes confocal, widefield, transmitted light and deconvolution techniques.

Featured Equipment

X Series Compact Raman Spectrometer

Discover the X Series compact Raman spectrometer for superior performance within a compact design.

From Wasatch Photonics, Inc.

Femtosecond Fiber Laser : VINCI-1064

The VINCI series of ultrafast fiber lasers has a central emission wavelength of 1064 nm and features a unique combination of short pulse durations.

From TeraXion Inc.

Advanced F-Theta Lenses for Precision Imaging Systems

These F-theta lenses by Avantier are designed for consistent spot size and uniform field curvature correction, ideal for high-resolution imaging applications.

From Avantier Inc.