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Results 101 - 110 of 527 for Material properties
  • Can AFM be used for Imaging in Liquids?
    Article - 24 Jul 2023
    While AFM is commonly used for imaging in air and vacuum environments, the question arises: Can AFM be used for imaging in liquids? In this article, we will delve into the challenges and possibilities...
  • How are Metal Halide Perovskites Transforming Optoelectronics?
    Article - 18 Jan 2023
    In this interview, AZoOptics talks with Prof. Wei Huang and Dr. Chenxin Ran about their paper analyzing the extraordinary role of metal halide perovskites in the optoelectronic industry. After...
  • Atomic Force Microscopy for Nanoparticles
    Article - 25 Aug 2022
    The high-resolution property of atomic force microscopes enables this powerful tool to be ideal for the characterization of nanoparticles and nanomaterials due to providing qualitative and...
  • What is Infrared Spectroscopy Used For?
    Article - 19 May 2022
    Infrared (IR) spectroscopy is the most widely used experimental material characterization and analysis technique. This article takes a closer look at the method and its importance within several...
  • How Annealing Methods Improve Optical Component Manufacture
    Article - 17 May 2022
    Annealing procedures play an essential role in the fabrication of optical components. These heat treatments are being researched to improve the performance of optical components. This article looks at...
  • The Role of SEM and TEM Techniques in Designing Nanomaterials
    Article - 24 Mar 2022
    Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) have widespread applications in characterizing nanomaterials’ composition, interfacial strain and structure, morphology,...
  • The Use of Scanning Electron Microscopy for Nanoparticle Detection
    Article - 22 Mar 2022
    Controlling the physical and chemical properties of nanoparticles requires a comprehensive study on a clear and accurate image of the particles. A highly sophisticated scanning electron microscope has...
  • On-Chip Perovskite Polariton Parametric Oscillator with a Low Threshold
    Article - 17 Dec 2021
    Wu, J. et al.'s study discusses a low-threshold on-chip perovskite polariton parametric oscillator using all-inorganic CsPbBr3 microcavities at ambient temperature.
  • Ellipsometry: What is it and Why is it Useful in Optics?
    Article - 1 Apr 2021
    Ellipsometry is an analytical technique that allows for the determination of various material and structural properties, this article discusses its principles, usage in optics, and other applications.
  • Ellipsometric Porosimetry: An Introduction
    Article - 1 Apr 2021
    Ellipsometric porosimetry is a powerful analytical technique that allows for the measurement of the thickness and optical properties of many materials and structures.

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