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New DualBeam System from FEI Combines SEM Imaging and FIB Milling Performance

New DualBeam System from FEI Combines SEM Imaging and FIB Milling Performance

Bruker to Supply Customized N8 TITANOS Large Sample Atomic Force Microscope to NIST

Bruker to Supply Customized N8 TITANOS Large Sample Atomic Force Microscope to NIST

IBM Scientists Develop Breakthrough 3D-Nanopatterning Technique

IBM Scientists Develop Breakthrough 3D-Nanopatterning Technique

Researchers Use Scanning Tunnelling Microscope to Analyze New Superconductivity Mechanism

Researchers Use Scanning Tunnelling Microscope to Analyze New Superconductivity Mechanism

Malvern to Exhibit OINDP Instruments That Complement its Spraytec Laser Diffraction Analyzer

Malvern to Exhibit OINDP Instruments That Complement its Spraytec Laser Diffraction Analyzer

Morphologi G3 Microscopy-Based Image Analysis System Exhibited at PTXi 2010

Morphologi G3 Microscopy-Based Image Analysis System Exhibited at PTXi 2010

New Miniature, Lensless Microscope for Telemedicine Applications

Mystery of Fluorescent Proteins' Molecular Nature Leads to Development of New Imaging Probes

SIINT Enhances SDDs Used for Electron Microscopy Applications

SIINT Enhances SDDs Used for Electron Microscopy Applications

NanoImaging Secures SBIR Fund to Develop New Methods Using Electron Microscopy

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