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Micorscience 2010 Sets New Delegate Record

MICROSCIENCE 2010, the Royal Microscopical Society's flagship meeting held at ExCeL London at the end of June, attracted 519 conference delegates - the first time that the 500-barrier has been broken. And, the overall visitor-target of 2,000 was also reached.

From Royal Microscopical Society 19 Jul 2010

Carl Zeiss Launches New EVO HD Scanning Electron Microscope

Carl Zeiss, provider of medical research and industrial solutions, has launched a new EVO HD scanning electron microscope in the C-SEM (conventional Scanning Electron Microscopy) market.

From Carl Zeiss Microscopy GmbH 17 Jul 2010

Olympus and Biolmagene Sign Patent License Agreement

Olympus America, specialist in next-generation microscope imaging systems, has signed a licensing agreement with a California-based company, Biolmagene.

17 Jul 2010

Combined Atomic Force Microscopy-Raman Systems from Veeco Instruments

The atomic force microscopy technology company, Veeco Instruments, has launched the IRIS (Integrated Raman Imaging System) models for the BioScope Catalyst and Innova AFMs (Atomic Force Microscopes).

From Veeco 15 Jul 2010

New CSP Optical Test Socket from Aries Electronics

Aries Electronics has announced its new CSP test socket that is used for failure analysis (FA) testing for optical sensor, or EMMI (emission microscopy) applications.

30 Jun 2010

ASU Cowley Center to Install Aberration-Corrected Electron Microscopes

The John Wheatley Education and Outreach Room was dedicated for Solid State Science at LeRoy Eyring Center of Arizona State University.

30 Jun 2010

Innovator in Super Resolution to Inaugurate MICROSCIENCE 2010

The opening Plenary Lecture at MICROSCIENCE 2010 would be delivered by Dr Jennifer Lippincott-Schwartz, a groundbreaker in super resolution imaging.

29 Jun 2010

Leica Microsystems and KaVo Dental Enter into Strategic Alliance

Leica Microsystems announced that it has entered into a strategic alliance with KaVo Dental to develop and market its dental products in European countries.

From Leica Microsystems GmbH 28 Jun 2010

CRAIC Technologies Launches New Microspectrophotometers to Measure Thin-Film Thickness

CRAIC Technologies, a manufacturer of UV-visible-NIR microspectrometers and microscopes, launched the 20/20 Film microspectrophotometer. The 20/20 Film solution measures the thickness of thin films such as sub-micron sampling areas non-destructively and rapidly.

11 Jun 2010