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Researchers Develop Rare-Earth-Ion-Doped Amplifiers with High Optical Gain

In the University of Twente, Prof. Markus Pollnau and his colleagues, who belong to the MESA+ Institute for Nanotechnology, have created an optical amplifier doped with rare earth ion.

11 Jan 2012

Checkpoint Technologies Unveils 3.0 NA SIL for Optical Failure Analysis Tools

Checkpoint Technologies, a provider of laser scanning and photon emission microscopy systems for applications in the failure analysis industry, has unveiled its 3.0 numerical aperture (NA) solid immersion lens objective (SIL).

7 Jan 2012

Novel Method of III-V Nanostructure Fabrication Helps Develop Advanced Optoelectronic Devices

A research team led by Xiuling Li, who serves as a Professor of electrical and computer engineering at the University of Illinois at Urbana-Champaign, has developed a low-cost method to fabricate high-aspect-ratio, large-area III-V nanostructures for applications in advanced optoelectronic devices such as lasers and solar cells.

26 Dec 2011

OptoHiT Phototransistor Optocoupler Series Offers Reliable Isolation at High Temperatures

Industrial applications experience increased temperature and reduced volume in motor control, power supplies and consumer applications like adapters and chargers, thereby posing a challenge to designers.

From Onsemi 23 Nov 2011

Nanometrics Announces Acquisition of Nanda Technologies

Nanometrics, a provider of advanced process control metrology solutions and inspection systems for fabrication of LEDs, semiconductors, solar photovoltaics and data storage devices has acquired Nanda Technologies of Munich, Germany.

23 Nov 2011

Toppan Photomasks Announces Capacity Expansion Plans for JV Facility in Shanghai

Toppan Printing’s subsidiary, Toppan Photomasks has declared plans to invest $20 million to expand the production capacity and technology capabilities of its Shanghai joint venture facility in order to meet the growing demand of the semiconductor industry in China.

19 Nov 2011

Nordson DAGE Bondtester Pad Cratering Inspection System Wins Global Technology Award

Nordson DAGE, a provider of bond test equipment and digital X-ray inspection systems for the semiconductor and printed circuit board assembly industries, has won a Global Technology Award for its bond equipment, the 4000Plus Bondtester Pad Cratering Inspection System.

18 Nov 2011

Advanced Extreme-Ultraviolet Microscope for Creation of Computer Chips

The Lawrence Berkeley National Laboratory has developed the Semiconductor High-NA Actinic Reticle Review Project (SHARP) microscope for photolithography.

3 Nov 2011

Laser Based Setup Improves the Efficiency of Organic Solar Cells

Organic solar cells have the potential to convert sunlight into electrical energy in an economical and environmentally friendly fashion. The challenge is that they still work less efficiently than inorganic semiconductors. Ultrafast measurements on hybrid cells now reveal a route to double their efficiency.

24 Oct 2011

Fujitsu’s New Optical Amplifier Technology Developed for Optical Access Systems

Fujitsu and Fujitsu Laboratories have developed a new optical amplifier technology to be utilized in the optical access systems, which connects central offices to the subscribers. This new optical technology enables the splitting number into four times and double the transmission distance.

15 Oct 2011