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  • Laser-Driven Light Sources and the Future of Photonics Innovation
    Article - 6 Jun 2022
    Following Laser World of Photonics 2022, we spoke with Matthias Sachsenhauser from Hamamatsu Photonics about the role of laser-driven light sources in the future of the photonics sector.
  • Analyzing Polymers with Microscopy: Principles and Applications
    Article - 29 Mar 2022
    The microscopic characterization of polymers is key to the understanding of the fundamental structure-function relation on a molecular level and paves the way toward the rational design of novel and...
  • Speeding Up X-Ray Fluorescence Chemical Mapping with Ghost Imaging
    Article - 18 Feb 2022
    AZoOptics speaks to Yishai Klein, Research Physicist from Bar-Ilan University, about his x-ray fluorescence technique based on computational ghost imaging. The new method overcomes current challenges...
  • Head-up Displays (HUD) in Aviation and Their Quality Considerations
    Article - 31 Mar 2021
    A head-up display (HUD) is a transparent display displayed into the line-of-sight of, in this case, a pilot. They are critical in aviation as they allow pilots to maintain focus on the environment....
  • An Introduction to Optical Metrology
    Article - 29 Oct 2024
    In precision engineering, optical metrology is essential for non-contact measurement, employing light-based methods for accurate analysis across industries like electronics, manufacturing, and...
  • Examining the 3D Applications of Smart Camera Systems
    Article - 1 Nov 2018
    The EyeScan 3D sensor is a new smart camera system, which can be used for various 3D applications including quality control, and accurate measurements.
  • Comparisons of Microscopy Techniques
    Article - 5 May 2017
    Microscopy is a technical field that employs instruments, called microscopes, to examine minute objects that are invisible to the naked eye, by magnifying or enlarging the image of the object.
  • Model-Based Transparent Surface Films Analysis
    Article - 17 Apr 2017
    Model-based CSI enables precise surface and film thickness metrology, crucial for diverse applications, with robust, sample-agnostic calibration.
  • Measuring High Power Lasers
    Article - 3 Dec 2015
    Gary Wagner, President of Ophir-Spiricon, spoke to AZoOpitcs about how extremely powerful lasers are driving new innovations in manufacturing and the military, the difficulties researchers face when...
  • Thirty Years of Experience in Supplying Custom LEDs
    Article - 3 Dec 2015
    AZoOptics speaks to Marktech Optoelectronics' CEO, Mark Campito, President, Bill Moore, and CTO, Vincent Forte about their extensive product range.

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