Search

Search Results

Results 651 - 660 of 663 for Measuring Controlling Devices

What Is Diffraction?

Article - 29 Jul 2024

What is diffraction? Explore diffraction's role in wave-particle duality and its applications in science and technology, from X-ray crystallography to piezoelectric ceramics.
Digitally Transformed Lidar System with Resource-Saving TDC

Article - 23 Jun 2022

A recent paper illustrated a low-cost digitally integrated LiDAR with TDC that is completely FPGA-controlled and processed in a low-end FPGA chip with constrained configurable logic block resources.
Efficacy of Far-UVC in Inactivating an Airborne Pathogen

Article - 20 Apr 2022

For the first time, a study has displayed the capability of Far-UVC to rapidly reduce airborne pathogens in a realistically sized room with normal ventilation and a constant source of airborne...
Measurement and Correction of Aberrations Using SPAM and Deformable Lens Module

Article - 17 Jan 2022

This article looks at Furieri, T. et al.'s research paper which analyzes a method to achieve anisoplanatic aberrations in a small optical module that can identify and correct aberrations.
Feasibility of Measuring Changes in Gas Volume Using GASMAS Technology

Article - 24 Nov 2021

Biophotonics tools have been accounting for a larger proportion of next-generation diagnostic and therapeutic modalities, provided that they offer information of tissue functionality and composition...
MicroLED Displays: Measuring and Correcting Uniformity

Article - 22 Feb 2021

MicroLED displays have impressive visual performance. However, there are issues. As they are individual emissive elements, microLEDs can show high variability in image properties, measuring and...
DUV and VUV Microlithographic Objective Optical Designs

Article - 20 May 2020

Microlithographic objectives were developed for DUV and VUV wavelengths used for printing and inspection applications related to microlithographic processes.
Near-Eye Display Measurement for AR/VR Headsets

Article - 29 Oct 2019

In this article, we examine the challenges of near-to-eye display (NED) measurement to examine device quality for AR, VR and MR headsets.
Measuring the Optical Performance of Head-Up Displays

Article - 29 Oct 2019

Head-up display (HUD) technology is increasing significantly, and to meet appropriate standards, they need to go through efficient measurement systems.
Using Nonlinear Optical Pump-Probe Microscopy for 3D High Resolution Imaging in Modern Microscopy

Article - 22 Mar 2019

This article discusses how to use nonlinear optical pump-probe microscopy for 3D high resolution imaging in modern microscopy.

Featured Equipment

Advanced F-Theta Lenses for Precision Imaging Systems

These F-theta lenses by Avantier are designed for consistent spot size and uniform field curvature correction, ideal for high-resolution imaging applications.

From Avantier Inc.

Off-Axis Parabolic (OAP) Mirrors: Precision Solutions for Advanced Optical Systems

Shanghai Optics provides high-precision off-axis parabolic (OAP) mirrors designed for advanced optical systems, offering superior reflective solutions for applications requiring precise light collimation and focus.

From Shanghai Optics