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Results 91 - 100 of 199 for AFM
  • How Piezoelectric Feedback Boosts Infrared Atomic Force Microscopy
    Article - 8 Mar 2021
    Scientists at the Beckman Institute for Advanced Science and Technology at the University of Illinois have suggested a new approach to improve AFM-IR measurements' sensitivity.
  • Polytec
    Supplier Profile
    At Polytec, we specialize in advanced optical measurement systems and cutting-edge testing services, all tailored to meet your unique needs. Our focus is your success. With a dedicated commitment to...
  • Using Atomic Force Microscopy to Look at Thin Ice
    Article - 22 Apr 2022
    Images of two-dimensional ice captured using atomic force microscopy (AFM) demonstrate a previously unseen growth mechanism.
  • Ladd Research
    Supplier Profile
    Ladd Research began in 1955 with the goal of supplying the needs of researchers using electron microscopes. Over the years we have expanded our product line to include supplies and accessories for...
  • MS MacroSystem
    Supplier Profile
    MS MacroSystem offers professional 3D and 4D graphics software for science and technology that allows you to analyze data quickly and accurately. Our unique set of interactive 3D measurement tools was...
  • Combined Atomic Force Microscopy-Raman Systems from Veeco Instruments
    News - 15 Jul 2010
    The atomic force microscopy technology company, Veeco Instruments, has launched the IRIS (Integrated Raman Imaging System) models for the BioScope Catalyst and Innova AFMs (Atomic Force Microscopes)....
  • Using Atomic Force Microscopy to Study Meteorites
    Article - 17 Mar 2022
    Recently, scientists from the IBM Research laboratory in Zurich, in collaboration with a multinational research team, studied organic molecules from meteorites using ultra-high-resolution atomic force...
  • JPK Instruments Limited
    Supplier Profile
    JPK Instruments AG is a world-leading manufacturer of nanoanalytic instruments - particularly atomic force microscope (AFM) systems and optical tweezers - for a broad range of applications reaching...
  • Line-Scanning High-Speed Atomic Force Microscopy and the Future of Optogenetics
    Article - 22 Apr 2022
    AZoOptics speaks to Prof. Simon Scheuring & Dr. Alma P. Perrino about their recent research using a new line-scanning high-speed atomic force microscopy technique. The method helps characterize the...
  • University of Freiburg and Park Systems Europe Announce the 4th NanoScientific Forum Europe on September 15-17, 2021
    News - 5 Nov 2020
    After the successful 3rd virtual edition of the 2020 NSFE, we are excited to invite researchers from all fields of Scanning Probe Microscopy to the fourth edition of the NanoScientific Forum Europe as...

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