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MKS Announces New Ophir® High Resolution Beam Profiling Camera with USB 3.0 Interface for Measuring CW and Pulsed Lasers

MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the new Ophir® SP920 USB 3.0 Silicon CCD High Resolution Beam Profiling Camera at Laser World of Photonics.

From MKS Instruments, Inc. 27 Jun 2019

Shifted-Component Model Improves FLIO Data Analysis

We present a new model for analysis of fluorescence-lifetime ophtalmoscopy data recorded with the Heidelberg Engineering FLIO system.

From Becker & Hickl GmbH 26 Jun 2019

Wasatch Photonics Launches WP OCT Software Platform as Enabling Tool for OCT System Development

Wasatch Photonics announces the launch of its WP OCT software platform as an enabling tool for research and OEM development, with the power and flexibility to speed OCT system development.

From Wasatch Photonics, Inc. 26 Jun 2019

Olympus Stream Software. Inspection Without Limitation

With the new Olympus Stream 2.4 software, users in all industries – from electronics and semiconductors to general manufacturing, steel production and automotive – can now conduct fast and precise observations on a large variety of samples while maintaining data security and measurement reliability.

From Olympus Europa SE & Co. KG 24 Jun 2019

New Non-Line-of-Sight Imaging Method to Reconstruct Images in Great Detail

Computer vision scientists have shown that specialized light sources and sensors can be used to view around corners or through gauzy filters, thereby allowing them to rebuild the shapes of objects that are not seen.

21 Jun 2019

OmniVision Announces Its First 48 Megapixel, 0.8 Micron Image Sensor

OmniVision Technologies, Inc., a leading developer of advanced digital imaging solutions, today announced the OV48B, its first 48 megapixel (MP) image sensor featuring a 0.8 micron pixel size to enable high resolution smartphone cameras in a 1/2" optical format.

From OmniVision Technologies, Inc. 19 Jun 2019

Machine Learning Detects Scratches on Metal Surfaces

With the new Machine Learning Tool by EVT even scratches on metal surfaces can be detected.

From EVT Eye Vision Technology 11 Jun 2019

Olympus Launches Revolutionary Next-Generation Objectives

Olympus delivers a breakthrough to life science microscopy with the launch of its next-generation X Line objectives.

From Olympus Europa SE & Co. KG 10 Jun 2019

MKS Announces Ophir® Compact InGaAs Camera-Based Beam Profiling Systems for Eye-Safe Military, Telecom, and Medical Laser Applications

MKS Instruments, Inc., a global provider of technologies that enable advanced processes and improve productivity, has announced the Ophir® SP1201 and SP1203, compact, InGaAs camera-based beam profiling systems for real-time viewing and measuring of the optical performance of laser beams.

From MKS Instruments, Inc. 31 May 2019