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Texas Instruments Introduces DAC8562 for Portable Medical Devices

Texas Instruments (TI) has launched the DAC8562 family of dual 12-, 14- and 16- bit digital-to-analog converters (DACs). The DACs can be used in portable medical devices, laser modules, and wireless base stations.

24 Aug 2011

Nova Introduces Optical CD Metrology System with Multi-Channel Reflectometry

Nova Measuring Instruments has launched its new optical critical dimension (Optical CD) metrology system called Nova T600 to control the processes of sophisticated vertical architectures for the 22 nm technology node and further.

From Nova 12 Jul 2011

Zeta Instruments to Showcase Optical Metrology Technology at Intersolar North America Conference

Applied Materials in collaboration with Zeta Instruments, a manufacturer of precision optical profilers designed for micron-scale surface analysis, has published a paper titled, 'Texture Process Monitoring in Solar Cell Manufacturing Using Optical Metrology,’ which was presented at the 37th IEEE Photovoltaic Specialists Conference 2011.

11 Jul 2011

Graphene Breakthrough Moves it Closer to Applications in Optoelectronics

Graphene, a layer of carbon atoms only one-atom thick but about 200 times stronger than steel, is also one of the best electrical and thermal conductors on earth. In spite of the impressive list of promising prospects, graphene has a darker side: it does not have a band-gap, once it is conducting it cannot be switched-off.

7 Jun 2011

New Method Developed for Analyzing and Controlling Polarization of Light

A new method for analyzing and controlling the polarization of light has been developed by the Vienna University of Technology (TU Vienna) and Würzburg University researchers. Scientists have utilized thin layers of semiconductor materials for this.

31 Mar 2011

10X10 MSA Announces Availability of Ratified 100 Gb/s Module Specification

The 10X10 MSA, a group specializing in technology development for 100 Gb/s client interfaces, has announced the availability of 100 Gb/s module specification.

14 Mar 2011

Infinera Achieves Record 1 Tbps Speed on Single Photonic Integrated Chip

Infinera, manufacturer of photonic integrated circuits (PICs), has achieved a record speed of 1 Terabit/s on a single photonic integrated chip.

From Infinera 5 Mar 2011

JILA Scientists Develop Laser-Based Terahertz System

JILA scientists have created a terahertz radiation source that could prove useful to detect imaging weapons or trace gases in security screening applications. The system is resistant to damage and quite efficient when compared to similar systems.

28 Feb 2011

Rubicon CEO Makes Presentation at Lighting Symposium in California

Provider of sapphire products for optical, semiconductor and LED markets, Rubicon Technology declared that its Chief Executive officer and President, Raja Parvez, has made a presentation on latest LED technology achievements at the J.P. Morgan LED General Lighting Symposium. The event was held in Santa Clara, California, on 24 February 2011.

28 Feb 2011

Opto Diode Releases IRD X-Ray Detectors for Solar Spectrum Research

Opto Diode has unveiled a new range of semiconductor radiation sensors that are suitable for identifying photons and other particles.

From Opto Diode Corp. 17 Feb 2011

Featured Equipment

Advanced F-Theta Lenses for Precision Imaging Systems

These F-theta lenses by Avantier are designed for consistent spot size and uniform field curvature correction, ideal for high-resolution imaging applications.

From Avantier Inc.

Off-Axis Parabolic (OAP) Mirrors: Precision Solutions for Advanced Optical Systems

Shanghai Optics provides high-precision off-axis parabolic (OAP) mirrors designed for advanced optical systems, offering superior reflective solutions for applications requiring precise light collimation and focus.

From Shanghai Optics