Owais Ali

B.S. Mechanical Engineering

NEBOSH certified Mechanical Engineer with 3 years of experience as a technical writer and editor. Owais is interested in occupational health and safety, computer hardware, industrial and mobile robotics. During his academic career, Owais worked on several research projects regarding mobile robots, notably the Autonomous Fire Fighting Mobile Robot.

The designed mobile robot could navigate, detect and extinguish fire autonomously. Arduino Uno was used as the microcontroller to control the flame sensors' input and output of the flame extinguisher. Apart from his professional life, Owais is an avid book reader and a huge computer technology enthusiast and likes to keep himself updated regarding developments in the computer industry.

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Articles from Owais

X-Ray Photoelectron Spectroscopy in Surface Analysis: Probing Thin Films and Coatings

X-ray photoelectron spectroscopy (XPS) has become an indispensable characterization technique for analyzing the surface chemistry of thin films and coatings. With its ability to probe just the top few nanometers and reveal elemental composition, chemical bonding, and electronic structure, XPS provides unparalleled insights into how surface and interface properties determine film performance.

24 Aug 2023

What Is Laser Diffraction and How Is It Used to Measure Particle Size Distributions?

This article presents an overview of laser diffraction, its application in measuring particle size distributions, and its diverse uses across various industries.

7 Aug 2023

The Use of AFM for Polymer Science

Atomic force microscopy (AFM) has become an essential characterization tool in polymer research due to its unique capacity for multifunctional, nanoscale imaging and measurement. Recent advances have enabled AFM to probe complex polymer structures, functions, and behavior under real-world conditions across various scales.

3 Aug 2023

What Are the Main Components of An AFM System?

Since its invention in the 1980s, the atomic force microscope (AFM) has become indispensable for nanoscale imaging and metrology across scientific fields. At the heart of the AFM lies a host of precision components working in unison to acquire high-resolution topological images.

26 Jul 2023

How is Electron Microscopy Used for Tool Mark Analysis?

Electron Microscopy for tool mark analysis has revolutionized forensic investigations, offering unparalleled precision and clarity in examining minute surface details.

7 Jul 2023

How is Inductively Coupled Plasma Mass Spectrometry Used for Elemental Analysis?

By integrating an ICP instrumentation for sample atomization with mass spectrometry (MS) for precise detection, ICP-MS offers a comprehensive solution for elemental analysis in various fields of research and industry.

5 Jul 2023

How is Spectroscopy Used to Analyze Fire Debris?

By harnessing spectroscopic techniques' sensitivity and non-destructive nature, investigators gain more accurate and comprehensive insights into fire debris composition and origin.

30 Jun 2023

How is Mass Spectrometry used in Partnership with Spectroscopy?

The combined use of mass spectrometry and spectroscopy in analytical chemistry offers a powerful approach to obtaining comprehensive chemical information with improved efficiency and reduced sample consumption.

27 Jun 2023

Environmental Mass Spectrometry: The Intersection Between Science and Sustainability

Environmental Mass Spectrometry is a powerful tool for detecting and analyzing trace amounts of pollutants in environmental samples. This article offers an overview of environmental mass spectrometry, its applications in environmental analysis, recent research advancements, and prospects.

22 Jun 2023

What to Know About Atomic Absorption Spectroscopy vs. Molecular Absorption Spectroscopy

This article explores the difference between these spectroscopic techniques, highlighting their unique advantages, limitations, and practical applications.

21 Jun 2023

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