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Results 1 - 10 of 39 for Dynamic Force Spectroscopy
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    Veeco is a global leader in Process Equipment technology. Our products combine innovative technological solutions with highest capital efficiency to drive our customer’s critical manufacturing...
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    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
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    At Wasatch Photonics, we’re fascinated by the many ways light can be used to understand nature and solve the problems that touch our lives each day, and it shows in our innovation, applications...
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    ZYGO designs, manufactures, and distributes high-end optical systems and components for metrology and end-user applications. ZYGO's metrology systems are based on optical interferometry measuring...
  • Article - 22 Jun 2009
    Current antibacterial drugs might become ineffective in the near future due to a phenomenon called pharmacoresistance. In this article vancomycinmodified tips were used to measure the forces and...
  • News - 18 Aug 2022
    In a pre-proof article posted in Ultramicroscopy, researchers presented combined photothermal and photovoltaic effects produced by light absorption in the visible spectrum by atomic force microscopy...
  • News - 29 Apr 2021
    Analyzing proteins at low concentrations, particularly those in a mixture of different conformations like intrinsically disordered proteins (IDPs), can be challenging. An illustration showing the...
  • Article - 9 Dec 2021
    Molecular structure elucidation by atomic force microscopy (AFM) has been demonstrated as a powerful method to gain insights into the structure and formation of matter.
  • News - 30 Sep 2020
    Scientists typically prefer to work with ordered systems. However, a diverse team of physicists and biophysicists from the University of Groningen found that individual light-harvesting nanotubes with...
  • Article - 3 Apr 2018
    Tip-Enhanced Raman Spectroscopy – or TERS – is a technique uniting the spatial resolution of atomic force microscopy (AFM) with the chemical information garnered from Raman Spectroscopy.

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