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Results 51 - 60 of 518 for Material properties
  • Advancing Low-Energy Electronics with Ultrashort Pulses of Light
    Article - 5 Nov 2021
    The idea of low-energy electronics is designing electrical components with minimal resistance that reduce their overall energy use. It is estimated that, worldwide, over 20 billion kWh of electricity...
  • How Can 2D Materials Be Used to Construct Waveguides?
    Article - 11 Apr 2018
    2D materials, from graphene to TMDCs, are gaining more widespread use at both an academic and commercial level. Additionally, new applications are always coming to light, and in this article, we look...
  • AFM - Sharp Tip vs. Colloidal Probe
    Article - 26 Oct 2018
    Atomic force microscopy (AFM), is a powerful, versatile technique for imaging & studying surfaces & is used throughout many scientific areas & industries.
  • Model-Based Transparent Surface Films Analysis
    Article - 17 Apr 2017
    Model-based CSI enables precise surface and film thickness metrology, crucial for diverse applications, with robust, sample-agnostic calibration.
  • Refraction and the Refractive Index
    Article - 30 Aug 2007
    When light passes from one medium to another of different density, its path of travel is bent. This phenomenon is known as refraction.
  • What Is the Difference Between Linear and Nonlinear Optics?
    Article - 5 Sep 2024
    The interplay between linear and nonlinear optics plays a fundamental role in advancing optical technologies, with important applications in telecommunications, microscopy, and quantum communication....
  • Atomic Force Microscopy in Semiconductor Manufacturing
    Article - 8 Jul 2024
    AFM techniques like C-AFM and KPFM are pivotal for nanoscale semiconductor characterization and ensuring device efficiency.
  • What are Photonic Topological Insulators?
    Article - 31 Jan 2024
    Exploring photonic topological insulators for robust light manipulation and potential in quantum computing and communication.
  • Optical Testing for Semiconductor Devices
    Article - 29 Sep 2023
    This article explores how key optical methodologies are applied to inspection, metrology, and analysis at various stages of semiconductor research, development, and volume manufacturing.
  • Surface Topography Imaging with AFM
    Article - 18 Sep 2023
    The surface topography of a material provides information on its mechanical and chemical characteristics, which are crucial in determining its applicability. Atomic force microscopy (AFM) is a robust...

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