In a paper published in the July 17 issue of the journal Nature, UCSB physicists Max Hofheinz, John Martinis, and Andrew Cleland documented how they used a superconducting electronic circuit known as a Josephson phase qubit, developed in Martinis's lab, to controllably pump microwave photons, one at a time, into a superconducting microwave resonator.
Solar cells of the future may look totally black to the human eye because they absorb light so efficiently. That's the promise of new research from an interdisciplinary team at the University of Virginia being funded by a new U.Va. Collaborative Sustainable Energy Seed Grant worth about $30,000.
At the Microscopy and Microanalysis 2008 meeting and exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, introduced a new, improved Helium Ion Microscope called the ORION® PLUS.
To enable the production of highly polished TEM lamellas Carl Zeiss SMT now offers an additional Argon ion beam column to its successful NVison 40 CrossBeam workstation.
At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.
At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a major upgrade of its LIBRA® 120 Energy Filter Transmission Electron Microscope (EFTEM).
FEI Company, a leading provider of high-resolution imaging and analysis systems, and Max Planck Institute (MPI) of Biochemistry, a leading biochemical research institution, announced today their collaboration on a correlative microscopy solution that enables scientists to quickly and easily acquire high-resolution transmission electron microscope (TEM) images of molecular entities found using optical microscopy techniques.
Hitachi has opened a new Advanced Scanning Electron Microscope Facility in the Cavendish Laboratories, Cambridge University. The long standing research collaboration between Hitachi and the Cambridge University has been enhanced with the installation of three state of the art scanning electron microscopes. The new facility will make some of Hitachi’s unique instruments, including the S-5500 in-lens SEM, openly accessible to university researchers.
The pinhole camera, a technique known since ancient times, has inspired a futuristic technology for lensless, three-dimensional imaging. Working at both the Advanced Light Source (ALS) at the U.S. Department of Energy's Lawrence Berkeley National Laboratory, and at FLASH, the free-electron laser in Hamburg, Germany, an international group of scientists has produced two of the brightest, sharpest x-ray holograms of microscopic objects ever made, thousands of times more efficiently than previous x-ray-holographic methods.
Today Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, announces the implementation of the 'Cropped Sensor' Mode as a standard, user-selectable feature with its iXon+, Newton and iKon range of high-performance EMCCD and CCD cameras. This highly flexible and specialized readout mode is capable of achieving extremely fast continuous frame rates (typically sub-millisecond exposures) of either images or spectra.
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