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Using Atomic Force Microscope, Researchers Study Nanoscale Structure of Bone Collagen

Using a technique that provides detailed images of nanoscale structures, researchers at the University of Michigan and Detroit's Henry Ford Hospital have discovered changes in the collagen component of bone that directly relate to bone health.

23 Dec 2009

Malvern Instruments Releases Online Note on ZEN1010 Zeta Potential Cell

A new application note, freely available on the Malvern Instruments’ website, describes how the new ZEN1010 high concentration zeta potential cell for the company’s market-leading Zetasizer Nano particle characterization system, overcomes a major hurdle in measuring the zeta potential of high concentration samples. Taking the notoriously difficult to measure titanium dioxide as an example, the authors describe experimental work that demonstrates accurate and reliable zeta potential measurement of concentrated, turbid suspensions.

21 Nov 2009

GSI Technologies Develops Printed Numeric Display Based on NTERA's NanoChromics Technology

GSI Technologies, LLC, a global ISO 9001:2000-certified printing technology company specializing in printed electronics, sensors, electrodes, lamps and displays, announces the development of a fully printed numeric display based on NTERA's NanoChromics technology that is fully compatible with industry standard hot lamination plastic card manufacturing. Segmented, numeric displays that are hot lamination compatible are the ideal solution for the emerging powered smart card market, where they are being adopted for two factor authentication solutions such as one-time passcodes, financial credit/debit cards, transportation cards and other stored value cards.

19 Nov 2009

Researchers Discover Way to Illuminate Inside of Cells Using Nanoparticles

If you're watching the complex processes in a living cell, it is easy to miss something important—especially if you are watching changes that take a long time to unfold and require high-spatial-resolution imaging

19 Nov 2009

Asylum Research Announces Grant Program for Band Excitation Technique Research

Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM), has announced a new grant program for early adopters to explore the capabilities and applications of the unique new Band Excitation technique. Existing or new Asylum AFM users are encouraged to apply for grants valued at up to $50,000 USD. Additional information on grant submission content and procedures is provided at http://www.asylumresearch.com/grants.

18 Nov 2009

Researchers Used 1 Milliwatt Tiny Beam of Light to Move Nanoscale Silicon Structure

With a bit of leverage, Cornell researchers have used a very tiny beam of light with as little as 1 milliwatt of power to move a silicon structure up to 12 nanometers. That's enough to completely switch the optical properties of the structure from opaque to transparent.

18 Nov 2009

Researchers Develop Nano-Colorsorter Device That Sorts Light in Tiny Spaces

Looking sharp and looking for light - Berkeley Lab researchers have engineered a new class of bowtie-shaped devices that capture, filter and steer light at the nanoscale

13 Nov 2009

Asylum Research Hosted Russian Scientists in Discussion on AFM Technology and Nanotechnology

Asylum Research, along with Intertech Corporation, Asylum’s representative for Russia, hosted a distinguished group of Russian scientists in late October to discuss the latest advances in AFM technology and nanotechnolog...

10 Nov 2009

Taylor Hobson Announces UK Government Investment in Centre of Excellence in Metrology

The new clean room, which consists of Class 7 (10,000) and Class 4 (10) areas, is equipped with the latest metrology instrumentation for micro and nano technologies (MNT).

9 Nov 2009

Nanometrics Receives Multi-System Order for Integrated Metrology and NanoCD Suite Solutions

Nanometrics Incorporated (Nasdaq:NANO), a leading supplier of advanced process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs, today announced a multi-system order from a leading semiconductor foundry for its Integrated Metrology (IM) and NanoCD™ suite solutions. The systems will be delivered in the fourth quarter of this year for optical critical dimension (OCD) metrology on 22nm gate etch applications.

3 Nov 2009

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