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Nikon Instruments Introduces the New MM-200 Measuring Microscope

Combining precision and accuracy with a compact body and an affordable price, Nikon Instruments, Inc. introduces the new MM-200 Measuring Microscope. Ideal for measuring a variety of metal, plastic and electronic parts, this powerful new microscope is specifically designed and engineered with machining engineers and inspectors in mind.

30 Apr 2009

Novel Continuously Running Camera that Captures Images Roughly 1000x Faster than Any Existing Conventional Camera

Ultrafast, light-sensitive video cameras are needed for observing high-speed events such as shockwaves, communication between living cells, neural activity, laser surgery and elements of blood analysis. To catch such elusive moments, a camera must be able to capture millions or billions of images continuously with a very high frame rate. Conventional cameras are simply not up to the task.

30 Apr 2009

Carl Zeiss Microscope Workshop Attracted Over 150 Scientists

More than 150 scientists and users of the ZEISS CrossBeam® and Helium Ion Microscope systems met at the 1st European user workshop in Dresden. In several sessions the participants got an overview on current product developments and new applications.

30 Apr 2009

New Optical Profiler Optimized for Non-Destructive Measurement of Surfaces

FRT presents a new profilometer at this year's CONTROL 2009 in Stuttgart. The optical profiler has been optimized for the non-destructive measurement of surfaces. The MicroSpy Profile measures roughness, contour, 3D topography, step height, planarity, geometry, volume, bearing contact area and more with metrological precision.

30 Apr 2009

New Microscope Streamlines Workflow While Providing Highest Quality Imaging

Advanced Microscopy Group (a division of Westover Scientific, Inc.) announced today the launch of its newest microscope, the EVOS fl for fluorescence imaging.

27 Apr 2009

IPOS Announces Launch with One-Day Symposium on The Photonic Universe

The Institute of Photonics and Optical Science (IPOS), the newest institute in the University of Sydney and the only one of its kind in Australia, launched this week with a one-day symposium The Photonic Universe - Faster, Further, Smarter.

23 Apr 2009

Carl Zeiss Introduces LSM 700 Laser Scanning Microscope

Carl Zeiss is setting a new performance standard for entry-level confocal microscopy with the introduction of the LSM 700 Laser Scanning Microscope, which uses proven modules from the world's largest range of fluorescence and laser scanning microscope systems to offer radical flexibility in both application and system structure.

22 Apr 2009

New Era of Research Begins as World's First Hard X-ray Laser Achieves "First Light"

The world's brightest X-ray source sprang to life last week at the U.S. Department of Energy's SLAC National Accelerator Laboratory. The Linac Coherent Light Source (LCLS) offers researchers the first-ever glimpse of high-energy or "hard" X-ray laser light produced in a laboratory.

21 Apr 2009

New Technique That Scrambles Light May Lead To Sharper Images

When photographers zoom in on an object to see it better, they lose the wide-angle perspective -- they are forced to trade off "big picture" context for detail. But now an imaging method developed by Princeton researchers could lead to lenses that show all parts of the scene at once in the same high detail.

21 Apr 2009

Olympus Introduces Latest Version of the Highly Successful LEXT Confocal Laser Scanning Microscope

Olympus has introduced the LEXT OLS4000, the latest version of the highly successful LEXT confocal laser scanning microscope metrology system. The OLS4000 brings a number of additional features and enhanced functionality, including near-vertical slope capabilities, larger optical zoom and navigation overview window.

21 Apr 2009