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Carl Zeiss SMT Introduces ORION PLUS Helium Ion Microscope

At the Microscopy and Microanalysis 2008 meeting and exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, introduced a new, improved Helium Ion Microscope called the ORION® PLUS.

4 Aug 2008

Third Column Makes NVision 40 Even More Versatile

To enable the production of highly polished TEM lamellas Carl Zeiss SMT now offers an additional Argon ion beam column to its successful NVison 40 CrossBeam workstation.

4 Aug 2008

New Class of SEM Centered on Unique GEMINI Technology

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a new class of SEM: SIGMA. Growing customer demand for ease of use and class leading X-ray and analytical geometry took center stage when the product was developed.

4 Aug 2008

Carl Zeiss SMT Redesign Vacuum System of LIBRA 120 EFTEM

At the Microscopy and Microanalysis Meeting and Exhibition being held in Albuquerque, New Mexico, Carl Zeiss SMT is introducing a major upgrade of its LIBRA® 120 Energy Filter Transmission Electron Microscope (EFTEM).

4 Aug 2008

Correlative Microscopy Solution Enables Scientists to Acquire High-Res TEM Images of Molecular Entities

FEI Company, a leading provider of high-resolution imaging and analysis systems, and Max Planck Institute (MPI) of Biochemistry, a leading biochemical research institution, announced today their collaboration on a correlative microscopy solution that enables scientists to quickly and easily acquire high-resolution transmission electron microscope (TEM) images of molecular entities found using optical microscopy techniques.

4 Aug 2008

Hitachi Opens New Advanced Scanning Electron Microscope Facility at Cambridge University

Hitachi has opened a new Advanced Scanning Electron Microscope Facility in the Cavendish Laboratories, Cambridge University. The long standing research collaboration between Hitachi and the Cambridge University has been enhanced with the installation of three state of the art scanning electron microscopes. The new facility will make some of Hitachi’s unique instruments, including the S-5500 in-lens SEM, openly accessible to university researchers.

4 Aug 2008

New Exhibition Opens Doors to Fascinating World of Microscopy

Small Matters: Exploring the World of Microscopy will be officially opened by the University of Sydney's new Vice-Chancellor and Principal Dr Michael Spence, on Wednesday, 6 August, 2008.

3 Aug 2008

World's First Analysis Microscope Without an Imaging Lens

Hitachi Ltd and Hokkaido University prototyped an electron analysis microscope that produces an enlarged image by irradiating an electron beam from a scanning electron microscope (SEM) to a specimen and analyzing the diffraction pattern of the scattered light.

30 Jul 2008

ICMS Imaging Centre Highlights Global Technology Leadership of FEI and its Products

India's International Centre for Material Science (ICMS) in Bangalore has selected FEI Company and its Mumbai-based agent, Icon Analytical Equipment Private Limited, to develop a unique imaging facility. It will be the most advanced electron microscopy facility in India and highlights the global technology leadership of FEI and its products.

29 Jul 2008

cellTRAY Offers Most Advanced On-Microscope Incubtor and Fluidics System

Nanopoint Inc., an award-winning developer of cellTRAY® Fluidics and Imaging System products, is announcing positive validation of its Model CT-2000 from early customers who range professionally from microfluidics system experts to award-winning pharmaceutical researchers.

29 Jul 2008