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Nikon Introduces Inverted Materials Microscope with an Innovative Design

Nikon Instruments, Inc. introduces the Eclipse MA200, an inverted materials microscope with an innovative design that has been optimized for digital imaging and ergonomic efficiency. The MA200 uses integrated intelligence to automatically combine captured images with data on their observation settings for more comprehensive documentation.

10 Sep 2008

$iXon+ EMCCD Cameras Used to Deliver 'Sub-Diffraction' Resolution at High Speed$

iXon+ EMCCD Cameras Used to Deliver 'Sub-Diffraction' Resolution at High Speed

Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today reported that their performance leading iXon+ EMCCD cameras have been used in the development of a new structured illumination microscopy approach that delivers 'sub-diffraction' resolution at high speed.

10 Sep 2008

NIST Researchers Probing Newest Microscope Technology to Further Improve Measurement Accuracy

Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the newest microscope technology to further improve measurement accuracy at the nanoscale. Better nanoscale measurements are critical for setting standards and improving production in the semiconductor and nanomanufacturing industries.

3 Sep 2008

Bruker Announces Launch of New Products and Options for SEM Based Materials Analysis

At the 14th European Microscopy Conference opening today, Bruker AXS Microanalysis announced the European launch of several new products and options for Scanning Electron Microscope (SEM) based materials analysis.

1 Sep 2008

Cutting Edge Laser Offering New Insight into the Tiny World of Activity Taking Place within Cells

Researchers at The University of Nottingham have developed a unique technology that will allow scientists to look at microscopic activity within the body’s chemical messenger system for the very first time, live as it happens.

28 Aug 2008

Agreement Allows Scientists to Perform Research with an Efficient, Stable and Bright Light Setting

Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, announced today that it has signed a global supply agreement with CoolLED Ltd. to integrate the company's PrecisExcite® LED light source for fluorescence microscopy in its own range of microscopy systems. This will allow scientists to perform their research with an efficient, stable and bright light setting.

28 Aug 2008

Exciting New Developments in Technology Having a Huge Impact on Public Health

Leaders in the field of microscopy from across Ireland will meet at Queen's University Belfast this week to discuss exciting new developments in technology which could have a huge impact on public health.

19 Aug 2008

New Drivers Enable Researchers to Enhance Performance of Microscopy Experiments

Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today announced the availability of drivers within µManager for their complete range of iXon+ and Luca EMCCD cameras. Within this environment, these drivers offer iCam-optimized acquisition to enable researchers to enhance the performance of microscopy experiments.

13 Aug 2008

$First 3-D Metamaterial Achieving Negative Refractive Index at Optical Frequencies$

First 3-D Metamaterial Achieving Negative Refractive Index at Optical Frequencies

Scientists at the University of California, Berkeley, have for the first time engineered 3-D materials that can reverse the natural direction of visible and near-infrared light, a development that could help form the basis for higher resolution optical imaging, nanocircuits for high-powered computers, and, to the delight of science-fiction and fantasy buffs, cloaking devices that could render objects invisible to the human eye.

11 Aug 2008

A New Type of Scanning Electron Microscope Developed by Hitichi

Hitachi High-Technologies Corporation has developed the SU8000, a new type of Field Emission Scanning Electron Microscope (FE-SEM) that features a newly developed top detector. The SU8000 was introduced on August 1.

7 Aug 2008