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Using the Instrument Transfer Function (ITF) to Interpret Interferometric Height Measurements

Using the Instrument Transfer Function (ITF) to Interpret Interferometric Height Measurements

Measuring the Radius of Curvature of Optical Surfaces

Measuring the Radius of Curvature of Optical Surfaces

Single-Camera Frame Instantaneous Interferometry - An Alternative Test Method

Single-Camera Frame Instantaneous Interferometry - An Alternative Test Method

Fizeau-Type Interferometer Optimized for Light-Efficient, Single-Frame Carrier Fringe Acquisition for Instantaneous Metrology at High Lateral Resolution

Fizeau-Type Interferometer Optimized for Light-Efficient, Single-Frame Carrier Fringe Acquisition for Instantaneous Metrology at High Lateral Resolution

The Electro-Optic Effect: Fundamentals of Electro-Optic Modulators

The Electro-Optic Effect: Fundamentals of Electro-Optic Modulators

EUV Lithography Light Source Technology

EUV Lithography Light Source Technology

Custom Solutions for Industrial Laser Processing

Custom Solutions for Industrial Laser Processing

Nanophotonics in Computing

Nanophotonics in Computing

Advanced Filter Technology from Lasers to Displays

Advanced Filter Technology from Lasers to Displays

OLED Technology in Display Screens

OLED Technology in Display Screens

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