Jun 11 2010
CRAIC Technologies, a manufacturer of UV-visible-NIR microspectrometers and microscopes, recently launched the 20/20 Film microspectrophotometer, which measures the thickness of thin films non-destructively and rapidly. The device can analyze films of several materials on opaque and transparent substrates as well. The combination of CRAIC Technologies’ proprietary contamination imaging with the new device can be deployed in the hard disk drive, flat panel display and semiconductor markets.
20/20 Film Microspectrophotometer from CRAIC Technologies
Dr. Paul Martin, CRAIC Technologies’ president, stated that the 20/20 Film was manufactured in response to user requests of a tool for measuring sub-micron areas on opaque and transparent substrates. The tool can be configured for relative intensity and concentration mapping, contamination analysis and others.
The 20/20 film tool integrates advanced microspectroscopy with high-level software to measure thickness of film. The 20/20 Film tool is devised for the production environment. The new device includes a capability of creating tools to analyze data,, and for automation options. The capability of directly imaging and analyzing films with visible, UV and NIR microscopy can be included in the instrument as an additional feature.