Posted in | News | Imaging | Microscopy

Gatan Launches New Ion Beam Based System for Microscopic Imaging and Microanalysis

Editorial Checklist

Reviewed

Apr 13 2010

large planar cross sections for microscopic imaging and microanalysis. The Ilion+ is a dedicated, ion beam based system for the preparation of large area planar cross sections from challenging SEM samples.

NEW Ilion+™

The Ilion+ uses a proprietary milling system that exposes significantly greater areas than traditional FIB milling while encompassing a wider range of delicate samples not compatible with mechanical polishing and other techniques. The system is easy to install and operate allowing users to begin making samples quickly. The Ilion+ design is based on the proven Gatan PIPS™ (Precision Ion Polishing System).

"Our beta results for the Ilion+ confirm our economic model predictions of a threefold reduction in cost per sample when compared to FIB," reports Kevin Scudder, General Manager, Gatan, Inc.

Source:

http://www.gatan.com/

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