Dec 16 2009
Lightwave Logic, Inc. (OTC Bulletin Board: LWLG) a technology company focused on the development of the "Next Generation Electro-Optic Platform" for applications in high speed fiber-optic telecommunications and optical computing, today announces that independent verification of earlier reported test results of its proprietary materials has been completed.
Lightwave Logic, Inc. first reported remarkable r33 results for its family of electro-optic materials in 2006. Those results showed that one of its materials exhibited an r33 value, the benchmark figure for electro-optic activity, 700% higher of an earlier standard material. Since that time, the company resynthesized its materials, prepared new test chips, and resubmitted them for testing by Dr. C.C. Teng and for independent testing by optical scientists at Photon-X.
This new set of independent testing data has completely verified the earlier testing results. High values of r33 translate into low power usage and low switching voltages for devices such as modulators built using our material.
"This new test data reaffirms that our material science is reproducible," said David Eaton, CTO of Lightwave Logic. "The test data shows that we can actually obtain r33 values higher than we reported in 2006. In addition, we have monitored the r33 value of several chips over time and the r33 value has not diminished over a 6-month period after the original testing occurred."
"We are now in discussion with several potential customers who should begin initial testing of our proprietary platform in the coming weeks," stated Jim Marcelli, Lightwave's CEO.