Posted in | News | Photovoltaics and Solar Cells

Elliot Scientific Announces Availability of CRAIC Technologies' QDI 2010 PV Instrument

Nov 11 2009

Elliot Scientific is now offering the CRAIC Technologies QDI 2010 PV instrument designed to measure the transmission and reflectance of photovoltaic cells of various types, be they traditional crystalline silicon, thin film or components thereof. Even protective glass and concentrator modules can be analyzed.

QDI 2010 PV Instrument

The QDI 2010 PV enables determination of thin film thickness in microscopic sampling areas from over 100 microns across to less than a micron on both transparent and opaque substrates. It also has a host of other functions and, in combination with CRAIC Technologies proprietary contamination imaging capabilities, it can locate and identify process contaminants.

Source:

http://www.elliotscientific.com/

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