Jul 16 2007
Following the tremendous success of the XGT-WR series with hundreds of units sold world wide, HORIBA Jobin Yvon unveils the second generation of its Energy Dispersive X-Ray Fluorescence Spectrometer at PITTCON 2007 in Chicago.
The XGT-1000WR and 5000WR were specially designed for WEEE/RoHS* (WR) regulations for the high sensitivity measurement of 5 elements (Pb/Cd/Cr/Hg/Br) in electronic and electrical devices. The NEW XGT-1700WR and 5700WR were designed to better meet the requirements of ELV regulations (End-of-Life Vehicles). Several innovations were used to achieve very good sensitivity for these same 5 elements in the wide range of complex matrices that can be found in automotive samples.
The main developments are in the optical system with the addition of a 3 mm X-Ray beam and a combined dual optical filter: The primary filter allows 4 combinations to improve the results by reducing the background, while the secondary filter increase the sensitivity.
The new XGT maintains the key features of the first generation which made it so popular, i.e., a large sample chamber and 2 selectable X-Ray Guide Tubes (XGT) with the smallest being 0.01 mm spot size. Other features are extremely easy operation for production use, simple and powerful software, automatic data export to MS Excel ™ with auto results evaluation.
Mapping, X-Ray transmission and full imaging capabilities are the key attributes for the XGT-5700WR, which is completing the product lineup with an instrument dedicated to R&D, investigation or design applications.
The XGT-1000WR and 5000WR will still continue to be sold as the reference for WR compliance testing. With the introduction of The XGT-1700WR and 5700WR for automotive industry (ELV), HORIBA Jobin Yvon keeps a step ahead in analyzer technology as well as environmental concerns.