NANOSENSORS has introduced the first two model of its novel scanning probe microscopy (SPM) probe lines of atomic force microscopy (AFM) tips, which exhibit high conductance and wear resistance.
The best of both worlds NANOSENSORS highly conductive wear resistant AFM probes
Platinum silicide (PtSi), which is highly conductive, has been used to produce the novel AFM tips. PtSi combines superior conductivity, which is greater when compared to diamond coating and equally good as metal coated tips, and higher wear resistance, which is greater when compared to metal coated probes and nearly good as diamond coated probes. In addition, the tip radius of the probe is slightly smaller than metal coated probes. Except SSRM, these tips can be used for almost all kinds of electrostatic or electric AFM measurement.
The probes can be employed for conductive AFM (C-AFM), scanning capacitance AFM (SCM), and tunneling AFM (TUNA), and can be applied for kelvin probe force measurements (KPFM) and electrostatic force measurements (EFM). The primary types including PtSi-FM (for force modulation mode) and PtSi-NCH (for non-contact mode) are available in the market currently. Furthermore, other types of AFM probes for conductive contact mode produced using novel materials and probes for SSRM are being developed.
NANOSENSORS is focusing on the manufacture and development of new probes for AFM and SPM. The products are specially designed for researchers at industrial R&D centres, research institutions and universities in medicine, chemistry, biotechnology, biology, semiconductors, materials research, nanotechnology and microtechnology disciplines.