Posted in | News | Microscopy

Comprehensive Book on Amplitude Modulation Atomic Force Microscopy

Editorial Checklist

Reviewed

Feb 19 2011

Research and Markets has released a new book from John Wiley and Sons, titled ‘Amplitude Modulation Atomic Force Microscopy’. The book offers a comprehensive analysis on the amplitude modulation atomic force microscopy.

The book discusses the instrumental considerations and provides an overview of the amplitude modulation AFM theory with applications of the method in industry and academia. It provides examples from biophysics, molecular biology, soft condensed matter, material science, and others. The information provided in the book will be ideal for readers with diverse backgrounds and expertise levels.

Key topics included in the report are beyond topographic imaging; multifrequency atomic force microscopy; resolution, noise and sensitivity; phase imaging atomic force microscopy; amplitude modulation AFM in liquid; advanced theory of amplitude modulation AFM; tip-surface interaction forces and instrumental and conceptual aspects.

Source:

http://www.researchandmarkets.com/

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