Feb 3 2011
Research and Markets has released a new report titled ‘The World Market for Electron and Scanning Probe Microscopes: Revised and Updated to 2011’.
The report provides a comprehensive analysis of the global market for electron and scanning probe microscopes.
According to the report, the global electron and scanning probe microscopes market that include Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM) and Atomic Force Microscopes (AFM) contributes for sales revenues of US$328.44 million in 2010. The annual sales of the market in 2015 would increase to about US$588.69 million.
The companies covered in the report are Carl Zeiss, JEOL, Hitachi High-Technologies and FEI Company. The key topics included in the report are report methodology, executive summary, company profiles, markets, Atomic Force Microscopes (AFM), Transmission Electron Microscopes (TEM) and Scanning Electron Microscopes (SEM).
The report provides regional and global markets for Scanning Electron Microscopes (SEM), Transmission Electron Microscopes (TEM) and Atomic Force Microscopes (AFM). In addition, it offers current and forecasted market revenues up to 2015 for end user markets such as fiber optics, ceramics, thin films, metallurgy, polymers, life sciences and biomedical, government and academia research labs, FA labs, nanotechnology and nanotechnology, data storage and semiconductors.