Dec 20 2010
WITec has released a new True Surface Microscopy option for applications in topographic confocal Raman imaging. An integrated sensor serves as the main component of the imaging mode for optical profilometry.
True Surface Microscopy
Topographic coordinates of large areas can be accurately correlated from the profilometer measurement together with data on large-area confocal Raman imaging. This action enables confocal Raman imaging over rough and heavily inclined samples with the true surface positioned in a constant focus. The imaging mode allows samples to be characterized conveniently and automatically.
The WITec Control and WITec Project software features comprehensive data evaluation and system control, and offers ease of operation. The True Surface Imaging mode provides profilometry functions of maximum scanning ranges of 100 × 100 mm with a 100 nm × 10 µm spatial resolution. In addition, the Imaging mode offers more flexibility for needs of variable sample sizes, and measures distances of 10 mm.
When integrated with an atomic force microscopy (AFM), the profilometer operates as a pre-inspection tool to find the topographic features of interest used in high-resolution AFM analysis on large samples. Furthermore, the imaging features benefit numerous applications such as imaging of the surface properties of pharmaceutical and biomedical materials; functionalized surface mapping; and characterization of semiconductor, medical, and micromechanical devices.