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Nemotek Uses Automated Testing Process to Manufacture Advanced Wafer-Level Cameras

Editorial Checklist

Reviewed

Dec 13 2010

Developer of wafer-level cameras, Nemotek Technologie has integrated a new automated testing process to deliver high-quality wafer-level cameras. The automatic testing technique minimizes time-to-market and enhances the efficiency of Nemotek’s wafer-level devices such as wafer-level cameras (WLC), wafer-level packaging (WLP) and wafer-level optics (WLO).

Nemotek can process more number of dices without any potential risks and in a controlled manner using the automated, multi-station testing. The comprehensive WLC assembly, testing and manufacturing process is conducted in the company’s wafer facility based in the Mediterranean region.

Nemotek Technologie’s Vice President, Hatim Limati stated that using the automatic testing system in business activities will enable the company to produce efficient wafer-level solutions with fewer defects. Limati added that the testing technique offers more control in the company’s operations.

Source:

http://www.nemotektechnologies.com/

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