Oct 7 2010
Provider of electron microscope systems, FEI, has announced that it has partnered with Nanonics Imaging, manufacturer of combined near-field optical microscopes. The agreement will allow both the companies to investigate the possibilities of including an atomic force microscope (AFM) with a FEI DualBeam FIB scanning electron microscope.
FEI DualBeam
Nanonics Imaging’s atomic force microscope is utilized for manipulating, measuring and imaging matter at the nanoscale range. The atomic force microscope utilizes a mechanical probe to determine a sample’s surface topography.
The DualBeam FIB/SEM system offers 3D imaging and analysis in the nanoscale range. The DualBeam utilizes a scanning electron microscope to image FIB-milled cross sections. These cross sections show the subsurface features.
Nanonics Imaging specializes in atomic force microscopes and combined near-field optical microscopes (NSOM or SNOM systems).
FEI is a scientific instruments company and specializes in providing ion-and electron-beam microscopes and systems for nanoscale applications such as natural resources, data storage, semiconductors, life sciences, academic and industrial materials research.