Jul 31 2010
Developer of portable color measurement systems, KMSA (Konica Minolta Sensing Americas) will be launching the whole family of photovoltaic characterization and measurement tools at the SPIE Optics and Photonics 2010 event. The event will be held from 3 - 5 August, 2010 at the San Diego Convention Center, California.
KMSA Solar Measurement Instrument
The new pseudo reference cell, developed by KMSA in collaboration with The National Institute of Advanced Industrial Science and Technology, will be displayed at the event. The pseudo reference cell is a measurement solution and is used as a standard calibration point for ensuring stable measurements of new photovoltaic cells.
The new reference cell offers a stable platform to KMSA for endorsing its photovoltaic characterization and measurement business. The company entered into this business because of a $20 million investment by Konarka Technologies and Konica Minolta Holdings to manufacture and supply thin-film photovoltaics.
KMSA’s Photovoltaic Business Manager, Bryan Bond, stated that the pseudo reference cell is designed especially for adjusting the solar simulators’ illumination for multi-junction solar cells. He further commented that the company is delighted to market the pseudo reference cell that has excellent spectral response on the existing technology.