New Optical Surface Profiler for HB-LED Production

Veeco Instruments will launch its new ContourGT Optical Surface Profiler at the SEMICON West trade shows in San Francisco. The Optical Surface Profiler is specifically designed to characterize HB-LED patterned sapphire substrates (PSS).

The ContourGT-X8 PSS features Veeco PSS metrology software and hardware technology as well as advanced three-dimensional (3D) measurement functions. The device also has a SDK (wafer automation System Developer’s Kit), which offers a customized solution for quality control applications.

Veeco Metrology & Instrumentation’s Executive Vice President, Mark R. Munch, said that the PSS technology ensures color consistency and improves the efficiency of HB-LEDs. The ContourGT-X8 PSS allows HB-LED makers and wafer suppliers to achieve the 3D surface metrology to ensure products’ quality and improved productivity easily and effectively, he said.

The VP of Veeco Optical Industrial Metrology, Ross Q. Smith, stated that the ContourGT-X8 PSS is designed to provide the necessary measurement capabilities for HB-LED manufacturers and the device is expected to set a benchmark as a PSS surface metrology solutions.