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JDSU Acquires Leading Provider of Fiber Optic Inspection and Cleaning Solutions

JDSU today announced that it has acquired the fiber division of Westover Scientific Inc., a leading provider of fiber optic inspection and cleaning solutions. Westover Scientific's products complement JDSU's existing fiber field and lab and production test portfolio and will be integrated with JDSU's Communications Test and Measurement (CommTest) business, now the largest provider of fiber optic test solutions in the world for service providers, labs and manufacturers.

7 Jan 2008

Researchers First to Achieve Optical Waveguiding of Near-Infrared Light

Researchers at the University of Illinois are the first to achieve optical waveguiding of near-infrared light through features embedded in self-assembled, three-dimensional photonic crystals. Applications for the optically active crystals include low-loss waveguides, low-threshold lasers and on-chip optical circuitry.

7 Jan 2008

Stimulated Emission Depletion Microscopes Sheds Light into a Smaller World

There are natural limits to resolution: spots that are less than about 300 nanometers apart cannot be displayed separately using a conventional light-optical microscope.

3 Jan 2008

Scientists Explains the Glue at the Core of Superconductivity

A team of Boston College researchers led by Asst. Prof. Vidya Madhavan (Physics) has identified an alternative explanation for the microscopic origins of the “glue” that binds electrons during high-temperature superconductivity, according to results published in the December 13 edition of the scientific journal Nature.

1 Jan 2008

Advancements in Emerging Field of Plasmonics Yield Revolutionary Technologies

Harry Potter may not have talked much about plasmonics in J. K. Rowling's fantasy series, but University of Maryland researchers are using this emerging technology to develop an invisibility cloak that exists beyond the world of bespectacled teenage wizards.

19 Dec 2007

Single-Photon Interference Leads to Faster X-ray Interferometers

By means of X-ray interferometers, lengths down to the mm range can be measured with a resolution of less than one nm. The low translation velocity of the interferometers, which made their use in practice more difficult, could now be increased by a factor of 100 by exploiting the temporal correlation of singly interfering X-ray photons.

19 Dec 2007

Materials Today Announces Top Ten Advances in Materials Science

What are the defining discoveries and great developments that are shaping the way we use materials and technologies today? Elsevier¡¦s Materials Today magazine has compiled a list of the top ten most significant advances in materials science over the last 50 years.

18 Dec 2007

PI Releases Large-Angle Steering Mirror Platforms Provide Precise Larger Angles, High Bandwidth & Stability

PI (Physik Instrumente) L.P. - a leading manufacturer of nanopositioning and piezo-based precision motion-control equipment for bio-nanotechnology, photonics and semiconductor applications-has extended the S-330 high-dynamics piezo tip/tilt platform family by several new large-angle models.

From PI (Physik Instrumente) LP 17 Dec 2007

New Imaging System That Quickly Maps the Mechanical Properties of Materials

The National Institute of Standards and Technology (NIST) has developed an imaging system that quickly maps the mechanical properties of materials - how stiff or stretchy they are, for example - at scales on the order of billionths of a meter. The new tool can be a cost-effective way to design and characterize mixed nanoscale materials such as composites or thin-film structures.

12 Dec 2007

Carl Zeiss Introduces New Transmission Electron Microscope

Carl Zeiss SMT today introduced the new CENTRA™ 100 transmission electron microscope (TEM) at the 47th Annual Meeting of the American Society of Cell Biology in Washington D.C. The CENTRA 100 is a TEM with up to 100 kV accelerating voltage. Specially designed as a sophisticated “imaging system”, the highly compact and robust instrument offers maximum resolution down to 0.2 nm.

11 Dec 2007