In-depth articles written by our editorial team focusing on the latest developments in materials science and technology
In an article recently published in the journal Applied Physics Express, researchers designed and fabricated a human-safe transverse quasi-phase-matched (QPM) aluminum nitride (AlN) channel waveguide with vertical polarity inversion that can kill pathogens on surfaces.
By Samudrapom Dam
2 Oct 2023
This article explores how key optical methodologies are applied to inspection, metrology, and analysis at various stages of semiconductor research, development, and volume manufacturing.
Infrared spectroscopy is a powerful analytical tool that was pioneered in the early 20th century. It analyzes samples by exploring interactions between matter and electromagnetic radiation in the infrared region. Today, the technique is used in both quantitative and qualitative analyses in a wide range of industries to study the chemical and molecular properties of a substance.
By Sarah Moore
28 Sep 2023
With advanced resolutions reaching sub-angstrom levels, electron microscopy provides direct visualizations of catalyst particles, support structures, and pores that complement spectroscopic and diffraction methods. When integrated with elemental analysis techniques, a comprehensive picture of catalytic systems can be built up from the microscopic level.
Electron microscopes are widely employed in laboratories worldwide to investigate structures too small to see with optical microscopes alone. Current trends are influencing the direction and growth of the market for electron microscopes, especially in the life sciences sector.
By Reginald Davey
25 Sep 2023
Atomic force microscopy's (AFM) nanoscale imaging and measurement capabilities allow researchers to gain molecular-level insights into membrane morphology, fouling, surface interactions, and performance under simulated water treatment conditions. These unique capabilities make AFM instrumental in understanding and optimizing the membranes and barriers central to water purification technologies.
Image analysis of particles is one of the key methods for particle characterization. This article discusses the major steps during the image analysis of particles.
By Samudrapom Dam
20 Sep 2023
Crystallography provides insight into the structure and properties of materials at the atomic level. While X-ray diffraction has traditionally dominated crystallography, Raman spectroscopy is now emerging as a powerful complementary tool for studying crystalline systems and advancing our understanding of materials.
The surface topography of a material provides information on its mechanical and chemical characteristics, which are crucial in determining its applicability. Atomic force microscopy (AFM) is a robust analytical technique often employed to study the surface topography of the majority of materials. This article provides an overview of AFM and its application in surface-topography imaging.
By Bhavna Kaveti
18 Sep 2023
Here, we explore the current applications of Raman spectroscopy and look at how the field is developing. We evaluate the global market for this analytical tool and consider how it may change in the near future.
By Sarah Moore
18 Sep 2023