McCrone Microscopes & Accessories reported that it has been licensed to distribute the JEOL NeoScope. The company is the instrument sales unit of the microscopy and materials analysis solution provider The McCrone Group.
NeoScope benchtop SEM
The JEOL NeoScope benchtop scanning electron microscope (SEM) is an automated model that is used to analyze material and biological samples. This microscope is different from other SEMs, as it automates settings that are commonly used. Thus the microscope is easy to use without compromising on the resolution of the image. The product can be used as an add-on to optical microscopic analysis in different applications such as geological, pharmaceutical and forensics research.
In addition to automated settings for brightness, contrast and focus, the SEM offers large depth of field and high resolution. This makes the JEOL NeoScope user-friendly and suitable for applications in research laboratories and classroom settings. The benchtop microscope is also ideal for advanced or new SEM users. The new product does not require special sample preparation for non-conductive as well as conductive samples.
The Director and Vice President of the Instrument Sales Division at McCrone Microscopes & Accessories, Jeff McGinn said that any laboratory that conducts optical microscopy analysis can use this device for in-house SEM analysis and avoid the need to send the samples to external SEM laboratories. The company offers a complete range of SEM accessories, service contracts and on-site training for the product.