New Atomic Force Microscope for Nanoscience Applications

Veeco Instruments Inc. (Nasdaq: VECO), the leading provider of atomic force microscopy technology to the nanoscience community, announced today the Dimension® Edge™ Atomic Force Microscope (AFM) System for physical and life sciences investigation.

This latest offering follows five major AFM releases from Veeco in 2009 alone, and offers the best-in-class performance of the Dimension Icon® in a simplified package with a compact footprint. Nanoscale researchers now can utilize the top levels of AFM capability at lower system costs and with streamlined operation.

“We continue to develop and release revolutionary new AFM products, modes and system improvements aimed at enabling our customers to push scientific boundaries and set new standards in their work,” said David Rossi, Vice President and General Manager of Veeco’s AFM Business. “We also want to break down the cost and productivity barriers facing today’s researchers. With the Dimension Edge, Veeco again shows its dedication to making nanoscale materials and device characterization accessible to every facility and user.”