Posted in | News | Optics and Photonics

XOS' HDXRF Technology Detects Toxic Metals in Children’s Jewelry

XOS today demonstrated to U.S. Senator Charles Schumer the company’s new High Definition XRF (HDXRF) for the detection of toxic metals in children’s jewelry. HDXRF provides the most precise, non-destructive measurement of cadmium, lead, and other heavy metals in the consumer-products industry. This breakthrough technology was developed by XOS and is currently in use by retailers, manufacturers, government labs, and third party testing labs to detect for toxic elements before the products get into the hands of consumers. “New York is fortunate to have forward thinking companies like XOS,” stated Senator Schumer. “By developing innovative technologies like the HDXRF they are not only addressing an important consumer issue but they are also creating jobs.”

XOS today demonstrated to U.S. Senator Charles Schumer the company’s new High Definition XRF (HDXRF) for the detection of toxic metals in children’s jewelry

In the wake of several widespread reports of the presence of cadmium and other toxic elements in children’s jewelry, Senator Schumer recently introduced legislation that would, for the first time, ban cadmium, barium and antimony in these products. While lead has been banned in such products for years, these other toxic elements referenced in Senator Schumer’s bill have not. XOS Inc, which fully supports Senator Schumer’s legislation, today showed him firsthand how HDXRF enables manufacturers and government enforcement agencies to detect these and other toxic elements.

This demonstration came on the heels of XOS meetings last week at the headquarters of the U.S. Consumer Product Safety Commission. XOS briefed the agency Chairman and other Commissioners as well as senior agency staff on the capabilities of HDXRF. “We were pleased to have had the opportunity to present our technology to the agency and to conduct a live demonstration of what we firmly believe is the most practical and precise measurement tool in the industry” said Berry Beumer, Vice President of XOS.

The presentation at CPSC Headquarters came on the final day of the demonstration of HDXRF at a major Washington, D.C. product safety conference. In addition, XOS exhibited at the 2010 American International Toy Fair in New York City. “We have worked extremely hard over the past two plus years on HDXRF and it is now becoming recognized as the gold standard for non-destructive product safety testing.” Beumer stated.

HDXRF accurately detects the presence of cadmium, lead, and other toxic elements separately in surface coating and in substrates of toys, jewelry, and other consumer products. Unlike its legacy predecessor XRF, HDXRF uses multiple-energy beams and specialized optics to analyze the paint layer separately from the substrate, while dramatically optimizing the detection sensitivity that often causes hand-held XRF instruments to miss elements such as lead and cadmium. This next-generation technology has been validated and proven effective in independent laboratory studies.

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