Jul 29 2015
The issue of which ICP-OES optical technology delivers the superior performance -- Echelle or ORCA.
Today's modern ICP-OES models take one of two approaches to optical design: echelle-based or Rowland Circle-based (as in Optimized Rowland Circle Alignment, or ORCA) technologies. Laboratory managers require a thorough understanding of each in order to select the appropriate instrument for their specific elemental analysis applications.
The new paper, "Which ICP-OES Optical Technology Offers Superior Performance? Echelle vs. ORCA" discusses the key advantages and disadvantages of both approaches to ICP-OES design.
In the discussion of the echelle optical technology, the paper explores the issue of light loss and stray light; optical limitations; spectral order overlap; wavelength-dependent resolution; problematic radial-view performance; and supplementing or replacing radial-view instruments with axial-view or dual-view systems.
In a review of the ORCA optical technology for spectrometers, the paper explores the topics of light loss; optical performance; spectral order overlap; wavelength resolution; radial-view performance, and other considerations.
The new whitepaper, "Which ICP-OES Optical Technology Offers Superior Performance? Echelle vs. ORCA" is available for download at http://icp-oes.spectro.com/echelle-vs-orca, from SPECTRO Analytical Instruments, a leading global supplier of analytical instruments for optical emission and X-ray fluorescence spectrometry for elemental analysis.