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Results 941 - 950 of 966 for Characterization
  • Overview of Laser Types and Lasing Media
    Article - 19 Aug 2024
    Lasers are categorized into thousands of types based on the lasing medium they use. The main categories—gas, liquid, solid-state, and semiconductor lasers—each possess distinct properties that...
  • Model-Based Transparent Surface Films Analysis
    Article - 17 Apr 2017
    Model-based CSI enables precise surface and film thickness metrology, crucial for diverse applications, with robust, sample-agnostic calibration.
  • Automated Photonic Device Assembly with Modular System Approach
    Equipment
    The AssemblyLine systems from FiconTec are high-precision, in-line assembly solutions designed for the automated production of photonic devices.
  • FAST-IR Series Infrared Cameras
    Article - 15 Jul 2014
    The FAST-IR Series from Telops consists of the fastest infrared cameras available on the market, making them suitable in the analysis of dynamic events.
  • An Introduction to Spectrophotometers
    Article - 28 Aug 2024
    Spectrophotometers are vital for optical analysis, measuring light behavior in materials to enhance research in chemistry, physics, and biomedical sciences.
  • Scattering: An Overview
    Article - 9 Aug 2024
    Scattering affects light and particle interactions, impacting technologies like Raman microscopy and laser interferometry, with applications in nanoscience and medical imaging.
  • Optical 3D Metrology in Industrial Opthalmic Applications
    Article - 27 Jan 2014
    With hundreds of millions of people choosing contacts for either visual or aesthetic reasons, and millions more having surgery to solve vision problems associated with aging, there is a growing need...
  • Saturn Deformable Mirrors for Adaptive Optic Applications
    Article - 10 Jun 2011
    Saturn is a membrane deformable mirror suitable for adaptive optics. It has an excellent capability by virtue of which it can push and pull the conducting membrane in it. This article describes how...
  • Surface Measurements Using White Light Interferometry
    Article - 5 Apr 2011
    White light interferometry is often deployed by industries and researchers for surface measurements. While this technique is fast and accurate, it suffers from a limitation in lateral resolution.
  • Overview and Product Solutions for Raman Spectroscopy
    Article - 3 Sep 2010
    It is the shift in wavelength of the inelastically scattered radiation that provides the chemical and structural information.

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