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Results 41 - 50 of 342 for Analysis and measurement
  • Laser-Based Techniques for Ultra-Precise Gas Measurements
    Article - 2 Jan 2024
    Laser gas analysis allows for gas detection with high sensitivity and selectivity. The multi-component capability and wide dynamic range of this detection method help analyze a mixture of gases with a...
  • Advancements in OCT Imaging for Ophthalmology
    Article - 18 Dec 2023
    Proper imaging eliminates invasive procedures, particularly during diagnosis. OCT is a commonly used non-invasive technique for eye care. This article explores the progress of OCT and its significance...
  • Digital Holography for 3D Display and Sensing
    Article - 7 Dec 2023
    Digital holography is an interferometric imaging technique that uses light waves to image multi-dimensional information such as three-dimensional (3D) structures, quantitative phases, and dynamics....
  • High-Precision Optical Metrology Techniques and Their Principles
    Article - 27 Nov 2023
    Optical metrology is the science of making precise measurements using light-based techniques. It enables non-contact characterization and inspection across diverse fields, including semiconductor...
  • Wavefront Analysis for High-Resolution Imaging Systems
    Article - 16 Oct 2023
    Wavefront analysis is used extensively to measure and characterize the wavefront of light beams in different applications, including optical testing, microscopy, and high-resolution imaging. This...
  • An Introduction to Thermal Imaging
    Article - 12 Oct 2023
    The utilization of specialized Infrared cameras consisting of infrared sensors to capture and develop the image of an object constitutes the process of thermal imaging. Our eyes detect visible light;...
  • Analyzing Light Propagation in Microscale Structures Using Geometrical Optics
    Article - 5 Oct 2023
    This article discusses the importance of geometrical optics, recent developments in this field, and the application of geometrical optics for light propagation analysis in microscale structures,...
  • Optical Testing for Semiconductor Devices
    Article - 29 Sep 2023
    This article explores how key optical methodologies are applied to inspection, metrology, and analysis at various stages of semiconductor research, development, and volume manufacturing.
  • How Is Electron Microscopy Used to Characterize Catalysts?
    Article - 26 Sep 2023
    With advanced resolutions reaching sub-angstrom levels, electron microscopy provides direct visualizations of catalyst particles, support structures, and pores that complement spectroscopic and...
  • Using AFM to Study Membranes in Water Treatment Facilities
    Article - 21 Sep 2023
    Atomic force microscopy's (AFM) nanoscale imaging and measurement capabilities allow researchers to gain molecular-level insights into membrane morphology, fouling, surface interactions, and...

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