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Robotic Telescope Registered Brightest Ever Observed Optical Burst from Distant Universe

On 19-03-2008 polish robotic telescope registered the brightest ever observed optical burst from the distant Universe. The results have just been published in the renowned scientific journal "Nature"

10 Sep 2008

Award-Winning PhlatLight LEDs Powering Two of the Newest Portable LED Based Projectors

Luminus Devices today announced that its award-winning PhlatLight® LEDs are powering two of the newest portable LED based projectors, the Samsung P400 Pocket Imager and LG Electronics' HS-102 Ultra-Mobile Projector. Both projectors are lamp-free, weigh less than two pounds and fit in the palm of a hand.

10 Sep 2008

Nikon Introduces Inverted Materials Microscope with an Innovative Design

Nikon Instruments, Inc. introduces the Eclipse MA200, an inverted materials microscope with an innovative design that has been optimized for digital imaging and ergonomic efficiency. The MA200 uses integrated intelligence to automatically combine captured images with data on their observation settings for more comprehensive documentation.

10 Sep 2008

New CCD Image Sensor Provides Full Support for High Speed HD Video

Eastman Kodak Company is helping to power the growth of High Definition image capture with a new CCD image sensor targeted to industrial and broadcast video markets.

10 Sep 2008

$iXon+ EMCCD Cameras Used to Deliver 'Sub-Diffraction' Resolution at High Speed$

iXon+ EMCCD Cameras Used to Deliver 'Sub-Diffraction' Resolution at High Speed

Andor Technology plc (Andor), a world leader in scientific imaging and spectroscopy solutions, today reported that their performance leading iXon+ EMCCD cameras have been used in the development of a new structured illumination microscopy approach that delivers 'sub-diffraction' resolution at high speed.

10 Sep 2008

Daylight Solutions Establishes New World Record for Broadly Tunable Solid State Mid-IR Laser

Daylight Solutions, Inc., a manufacturer of advanced molecular detection and imaging solutions, today announced that it has established a new world record for a broadly tunable solid state mid-infrared laser source in a commercial product. The company integrated a Quantum Cascade semiconductor gain chip from ALPES lasers (Switzerland) into its own patented tunable external-cavity laser (EC-QCL) system. The result was a single frequency source that tuned across 275 wavenumbers, or 24% of the laser's center wavelength at 8.8µm.

9 Sep 2008

World's First Wafer Bonder Specifically Designed for CMOS Image Sensor Production

At this year’s Semicon Taiwan, from September 9 to 11 in Taipei, SUSS MicroTec, a leading supplier of process and test solutions for the semiconductor industry, introduces the XBC300 Production Wafer Bonder for the CMOS Image Sensor (CIS) market. Visitors will have the opportunity to learn more about the world’s first wafer bonder product family specifically designed for CMOS Image Sensor production.

9 Sep 2008

High-Stability Si500 Provides Low Jitter and High Reliability for Consumer Applications

Silicon Laboratories Inc., a leader in high-performance, analog-intensive, mixed-signal ICs, today announced its entry into the consumer timing market with the introduction of the industry's highest stability 100 percent CMOS oscillator, offering a replacement for crystal oscillators (XOs) with shorter lead times, lower cost, higher reliability and higher performance.

8 Sep 2008

IrDA and VLCC Announces Research and Development Effort

The Infrared Data Association (IrDA) which establishes infrared standards that provide convenient wireless connectivity and the Visible Light Communications Consortium (VLCC) which is working on research, development, and the standardization of safe visible light communications (VLC) announce a cooperative agreement between the two organizations. This agreement recognizes the synergies between the organizations and the potential to cooperate in the promotion of optoelectronic technologies such as infrared and visible light communications.

4 Sep 2008

NIST Researchers Probing Newest Microscope Technology to Further Improve Measurement Accuracy

Just as test pilots push planes to explore their limits, researchers at the National Institute of Standards and Technology (NIST) are probing the newest microscope technology to further improve measurement accuracy at the nanoscale. Better nanoscale measurements are critical for setting standards and improving production in the semiconductor and nanomanufacturing industries.

3 Sep 2008