The new VariGATR™ grazing angle ATR accessory enables the testing of monolayers on metallic and semiconductor substrates. Its variable angle design allows for the optimization of the incident angle, enhancing sensitivity for these types of samples.
The accessory's uniquely designed pressure applicator ensures that the sample makes good contact with the Ge ATR crystal. The VariGATR™ not only delivers rapid and repeatable readings but also significantly increases sensitivity compared to traditional grazing angle techniques, all while maintaining ease of operation.
Key Features
The VariGATR™ grazing angle ATR accessory is designed with several main features that enhance its functionality and usability:
- Built-in pressure applicator with slip-clutch for consistent pressure application.
- Convenient horizontal sampling surface.
- Continuous angle variation from 60º to 65º for optimal sensitivity optimization.
- PermaPurge™ for expedited system purging.
- Anti-backlash mechanism for accurate and reproducible angle selection.
- Accommodates samples up to 8” in diameter and allows center-sampling of discs up to 6”.
- Mounted Ge ATR crystal.
- Optional features:
- Wire grid polarizer with slide plate mount enhances orientation analysis and spectral contrast.
- Force sensor with a digital read-out precisely measures the force exerted to establish a connection between the ATR crystal and the sample.
- Angular scale viewing aide for large samples.
- Low-torque slip-clutch.