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Results 1 - 10 of 976 for Characterisation
  • Kinetic Systems, Inc.
    Supplier Profile
    Kinetic Systems, Inc. has been at the forefront of vibration isolation and control since its inception in 1968. Through continuing research of vibration effects on equipment and structures, Kinetic...
  • Gatan, Inc.
    Supplier Profile
    Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are...
  • Polytec
    Supplier Profile
    At Polytec, we specialize in advanced optical measurement systems and cutting-edge testing services, all tailored to meet your unique needs. Our focus is your success. With a dedicated commitment to...
  • Filmetrics, a KLA Company
    Supplier Profile
    Filmetrics, Inc. was founded in 1995 with the mission of making thin-film measurements simple and affordable. Prior to our arrival, commercial thin-film measurement instruments cost $50,000 or more...
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • Zygo Corporation
    Supplier Profile
    ZYGO designs, manufactures, and distributes high-end optical systems and components for metrology and end-user applications. ZYGO's metrology systems are based on optical interferometry measuring...
  • Material Characterization with the EDAX Trident (EDS-EBSD-WDS) System
    Equipment
    The EDAX Trident Analysis System offers a solution for material characterization.
  • Dynamic Characterization of Encapsulated MEMS
    Equipment
    Dynamic characterization of MEMs devices is achieved by Micro System Analyzer MSA-650 IRIS.
  • Cedip Infrared Releases Powerful Software for Acquisition of IR Images
    News - 19 Nov 2007
    The latest revision of the ALTAIR software suite from Cedip Infrared Systems, further extends the utility of this popular product to meet the most demanding thermal analysis requirements in...

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