Tucson, AZ, December 12, 2024 - 4D Technology, a subsidiary of Onto Innovation, announced today the production release of the new one-megapixel (1 MP), high-resolution AccuFiz® Short Wavelength Infrared (SWIR) Fizeau interferometer. This release coincides with the delivery of multiple orders from leading U.S. defense and space-focused companies for the new AccuFiz SWIR interferometer.
The instrument was designed in response to the increasing needs of our customers’ component qualification and optical alignment needs in applications in aerospace, space and satellite communications, and earth-observing in the infrared.
The new AccuFiz SWIR Fizeau Interferometer, operating around the 1550nm wavelength, provides numerous advantages for optical measurements including:
- Industry-leading 1024 x 1024 camera resolution for improved spatial resolution to maintain the integrity of transmitted signals to tight tolerances, resulting in better imaging, less signal loss, and higher efficiencies of SWIR optical systems
- Unique capability to accept external sources at wavelengths throughout the C-Band, enabling manufacturers to test optical components and systems at every operational wavelength between 1535nm – 1565nm
- Temporal and dynamic acquisition modes for fast, vibration and turbulence-immune measurements
- Vibration immunity via dynamic interferometry to measure in challenging environments, without isolation
- Compact, lightweight design that simplifies test setups and use in multiple configurations
- Highly accurate measurement of concave, convex and afocal SWIR optics and systems, aspheres, windows, prisms, corner cubes, and other optics
- Real-time optical system alignment and collimation feedback
Infrared optics play a pivotal role in the space and U.S. defense industries due to their unique capabilities in detecting and analyzing thermal radiation. In space exploration, infrared optics facilitate the observation of celestial objects obscured by cosmic dust or faint in visible light. In earth observation satellites, they are used to monitor climate change, natural disasters, and environmental conditions by capturing thermal signatures and variations. In defense, infrared optics are used in surveillance, reconnaissance and targeting. They are also crucial in free space laser communications, helping to provide secure, reliable and fast transmission over long distances. In all these applications, it is essential to test the optical components and systems at the infrared operating wavelength to understand the final optical performance, whether it be fiber Product Announcement coupling efficiency, system level wavefront error, or other performance metrics. Additionally, individual component metrology can provide quick feedback to correct the as-built optical design for optimum system level performance.
“U.S. defense and space-based SWIR applications require optical systems that push the capabilities of today’s manufacturing and measurement techniques,” said Erik Novak, General Manager and Vice President of 4D Technology. “In response to this, we have strengthened our commitment to these application segments by providing a higher-resolution SWIR metrology system to provide precise measurements of wavefront error and surface figure at the critical SWIR wavelengths. Receiving these orders from industry leaders underscores the importance of investing in the development of our systems to meet the changing demands of our customers.”
4D Technology has been leading the development of metrology for space-based optics since its inception over 20 years ago. The company is uniquely positioned to support the development of U.S. defense and space-based IR applications, with capable metrology systems not only operating at SWIR wavelengths, but also from the NIR wavelength bands all the way to the LWIR wavelengths around 10.6µm.
The new 1 MP AccuFiz SWIR laser interferometer continues 4D Technology’s tradition of offering some of the world’s highest-performing interferometers, backed by industry-leading service and applications support.
About 4D Technology
4D Technology, an Onto Innovation subsidiary, is a global leader in dynamic and high-precision three dimensional surface metrology with its vibration-insensitive, portable, and automated dynamic laser interferometers, optical profilers, and optical surface gauges. Our systems provide precise measurement of surface features, roughness, and defects — even in the most challenging environments. Serving: precision machined surfaces, optics, astronomy, aerospace and defense, space-based telescopes, optical communications, automotive, and in-line production measurements. Additional information can be found at www.4dtechnology.com.
About Onto Innovation
Onto Innovation is a leader in process control, combining global scale with an expanded portfolio of leading edge technologies that include: Un-patterned wafer quality; 3D metrology spanning chip features from nanometer scale transistors to large die interconnects; macro defect inspection of wafers and packages; metal interconnect composition; factory analytics; and lithography for advanced semiconductor packaging. Our breadth of offerings across the entire semiconductor value chain combined with our connected thinking approach results in a unique perspective to help solve our customers’ most difficult yield, device performance, quality, and reliability issues. Onto Innovation strives to optimize customers’ critical path of progress by making them smarter, faster and more efficient. With headquarters and manufacturing in the U.S., Onto Innovation supports customers with a worldwide sales and service organization. Additional information can be found at www.ontoinnovation.com.