JDSU Launches Four New MAP-200 Optical Test and Measurement Modules

JDSU (Nasdaq: JDSU and TSX: JDU) today announced the introduction of four new modules for its MAP-200 optical test and measurement platform.

Since its release in June 2008, the number of MAP-200 application modules has grown to 16, increasing the value of a platform that helps customers reduce expenses and speed time-to-market with next generation network systems.

"With the rapid growth of broadband applications such as video on-demand, there is a growing need to cost effectively increase network capacity to 40G and in some cases 100G," said Gegs Jones, JDSU product line manager. "Continued R&D and manufacturing investments in the agile photonic layer technologies are driving next generation networks – and, require more advanced and sensitive photonic test capabilities offered by the JDSU MAP-200 platform."

The JDSU MAP-200 offers a broad base of tools for the most stringent test applications found in lab and manufacturing environments.  With its industry-leading features and specifications, the JDSU MAP-200 accelerates network system development and provides unmatched visibility into the performance of network elements and the photonic components and modules at their foundation.

The four new modules for the JDSU MAP-200 include:

• MAP Insertion/Return Loss (IL/RL) Meter (mORL–A1) - Provides the industry's first IL/ORL 4 wavelength solution in one single slot module. Highlights include an advanced design that supports ORL as low as >80dB at all 4 key telecom wavelengths (1310, 1490, 1550 and 1625nm) and a fully automated solution featuring mandrel-less hands free operation while testing jumpers as short as 70cm;
• MAP High-Performance Optical Power Meter (mOPM-B1) - New flexibility to configure models to measure high input power without integrating sphere (27dBm), or measure low input power (-80 dBm). It also provides buffering and high speed sampling, oscilloscope (such as triggering for transient capture), remote head options for work station ergonomics, and dense packaging (up to 4 detectors per slot);
• 100GE/40GE MAP Utility (mUTL-A1) - Designed to simplify the mechanical integration of passive optical components for automated test systems. It supports coupling, splitting and mux/demux functionality in a robust package and is ideal for individual lane testing on Wave Division Multiplexing (WDM) signals for 100GE and 40GE applications; and,
• MAP Tunable Distributed Bragg Reflector Laser (mTLG-A1) - A new-generation tunable laser that is ideal for DWDM/ROADM module testing and the optical amplifiers surrounding them. The high density (4 per module) enables cost effective deployment of tunable banks of lasers for system loading, routing and insertion loss tests. The lasers are tunable over the C- or L-bands with 25 GHz channel spacing.